Japanese

Nomarski differential interference observation

Observation of surface roughness and scratches of several angstrom level.

This function is optional.

By mounting the Nomarski differential interference optical system in the NH microscope unit, the optical system offers surface roughness and scratch observations in several angstroms.his optical system visually captures several angstrom level surface roughness and scratches, which normal bright field optical systems cannot capture, and assists NH Series to instantly determine the exact measuring area for quantitative roughness and step height measurements.

NH-3N equipped with the Nomarski optical system

The optical path diagram of NH Series with the Nomarski optical system

Image comparison at the center of a lens molding die

Bright field image

Nomarski image